Dec 20, 2016 | Uncategorized
“It is better to be vaguely right than exactly wrong.” Carveth Read wrote that sentence in his 1898 book Logic: Deductive and Inductive.1Although Read was not specifically referring to scientific measurements, the sentiment is the same — a high-precision...
Sep 26, 2016 | Uncategorized
Held in Rochester, NY, the hometown of the Optical Society of America (OSA) and our team at Applied Image, Frontiers in Optics (October 17-21, 2016) is a conference that brings together industry leaders and academic professionals to share the latest trends and...
Feb 3, 2016 | News and Press Releases
Announcing the New Applied Image Personal Identity Verification Calibration Standards Rochester NY With heightened security requirements for electronic personal identification and in response to the Homeland Security Presidential Directive-12, the NIST Federal...
Oct 26, 2015 | News and Press Releases
APPLIED IMAGE Announcing the NEW T-45 ANSI/ISEA Z87.1-2015 Resolution Test Standard Rochester NY APPLIED IMAGE Inc. is proud to announce its newest chart. It’s based on the latest ANSI/ISEA Z87.1.2015 Standard, American National Standard for Occupational and...
Oct 6, 2015 | News and Press Releases
Applied Image Announcing the NEW ISO-15426-1 Primary Reference Test Card for UPC-EAN Symbol Verifiers Rochester NY Applied Image Inc. is proud to announce the expansion of our Bar Code Test Card product line to include the new ISO 15426-1 Primary Reference Test Card...
